Device Metrics & Events view

Use the Device Metrics & Events view to create reports about the event data for devices and monitor types. If you have the Show Unmapped events permission, you can also view unmapped events in the reports for this view.

The Device Metrics & Events view contains the following folders and conditions:

• • Attribute
  • Custom dimension
  • Device
  • Device Group
  • Event Custom Dimension
  • Event Date Time
  • Event information
  • Event Measures
  • Event Notes
  • Event Operation
  • Event Related Incidents
  • Event Response Time
  • Event Status
  • Monitor Instance
  • Monitor Type
  • Performance
  • Rate Data
  • Thresholds Absolute Global
  • Thresholds Absolute Instance
  • Thresholds Signature Global
  • Thresholds Signature Instance
  • TSR user

Attribute

Custom dimension

Custom dimensions are multi-level filters that you can use to view the data of the parent filter. For example, if you use the Device - Monitor - Instance custom dimension, you can first filter devices. Based on the devices that you select, you can see the monitors for those devices. Based on the monitors that you select, you can see the instance names for those monitors.

The following custom dimensions are available out of the box:

• Device - Monitor - Instance
• Device - Monitor
• Event Host Class - Host
• Event Tool Class - Tool
• Event Object Class - Object
• Extended Slot Name - Value
• Monitor - Attribute
• BMC Infrastructure Management Server - Devices
• Device - Monitor - Attribute
• Device - Instance
• Event Origin Class - Origin

Device

Device Group

Event Custom Dimension

Event Date Time

Event information

Event Measures

Event Notes

Event Operation

Event Related Incidents

Event Response Time

Event Status

Monitor Instance

Monitor Type

Performance

Rate Data

Thresholds Absolute Global

Thresholds Absolute Instance

Thresholds Signature Global

Thresholds Signature Instance

TSR user