You can create a pattern from a pattern template or from CAM, both of which can be accessed from the Knowledge Management page. Additionally, you can create Software Instances (SIs) from discovered processes or discovered services.
You can also use a text editor and then upload the pattern file using the Knowledge Management page.
To create a pattern using a pattern template
- From the Knowledge Management page toolbar, click Create Pattern.
The Create Pattern page displays. The Create Pattern page provides a table with each row corresponding to a pattern template. For each pattern, the following information or link displays:
Select the pattern that most closely matches the task that you are working on and either copy and paste it into a text editor, or download the pattern using the download link.When you have written the pattern, you can upload it using the Uploading knowledge link on the Knowledge Management page.
- Name — The name of the pattern. Click a pattern name to view the pattern in the View Pattern template window. The View Pattern Template Window shows a read only version of the pattern with syntax highlighting where TPL keywords and variables are displayed in different colors to the other text. The Turn Line Numbering On/Turn Line Numbering Off button toggles line numbering and can be used to ease copying and pasting text from one of the templates. A button to close the window is also provided.
- Description — A read-only description of the pattern.
- Options — A download link. Clicking this enables you to download a copy of the pattern to your local file system.
For pattern testing you might need to be able to clean up the data your pattern models. See Destroying data for more information.
To create a BAI using CAM
The Create Pattern page provides a link to the CAM documentation. A link is also provided to the Manual grouping page which is the start point for the CAM process.
To create a SI pattern from discovered processes
Start with viewing discovered processes and follow guidance provided in creating SIs from discovered processes.